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TTTC's
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2006
ITC Special Section in Getting More out of Test Guest Editor: |
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CALL FOR PAPERS Deadline for Submission 10 April, 2006 |
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IEEE Design & Test seeks original manuscripts for the November-December 2006 Special ITC Section. The theme of the special section, and of the 2006 International Test Conference, is Getting More out of Test. Suggested topics include (but are not limited to)
Submissions must be new material. D&T will not reprint previously published ITC papers; however, submissions containing significantly new work based on previously published papers are welcome. To submit a manuscript, please access Manuscript Central, http://cs-ieee.manuscriptcentral.com, and select “Special ITC Section.” Please also send a PDF copy to Guest Editor Ken Butler (kenb@ti.com). To be a reviewer, contact dt-ma@computer.org. The submissions schedule is as follows:
Acceptable file formats include MS Word, ASCII or plain text, PDF, and PostScript. Manuscripts should not exceed 5,000 words (with each average-size figure counting as 150 words toward this limit), including references and biographies; this amounts to about 4,200 words of text and five figures. Manuscripts must be doubled-spaced, on A4 or 8.5-by-11 inch pages, and type size must be at least 11 points. Please include all figures and tables, as well as a cover page with author contact information (name, postal address, phone, fax, and e-mail address) and a 150-word abstract. Submitted manuscripts must not have been previously published or currently submitted for publication elsewhere, and all manuscripts must be cleared for publication. Accepted articles will be edited for structure, style, clarity, and readability. Please read IEEE Design & Test author guidelines at http://www.computer.org/dt/author.htm. |
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Computer Society– Test Technology Technical Council |
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